ARGONNE, Ill. ― A team of researchers from the U.S. Department of Energy's Argonne National Laboratory and Ohio University have devised a powerful technique that simultaneously resolves the chemical characterization and topography of nanoscale materials down to the height of a single atom.
The technique combines synchrotron X-rays (SX) and scanning tunneling microscopy (STM). In experiments, the researchers used SX as a probe and a nanofabricated smart tip of a STM as a detector.